Produzione Scientifica Maurizio Dapor


  • Maurizio Dapor, Nicola Bazzanella, Laura Toniutti, Antonio Miotello, Michele Crivellari, Stefano Gialanella, "Backscattered electrons from gold surface films deposited on silicon substrates: a joint experimental and computational investigation to add new potentiality to electron microscopy" in SURFACE AND INTERFACE ANALYSIS, v. 45, (2013), p. 677-681. - DOI: 10.1002/sia.5144 - vedi dettaglio
  • Maurizio Dapor, Lucia Calliari, Sergey Fanchenko, "Energy loss of electrons backscattered from solids: measured and calculated spectra for Al and Si" in SURFACE AND INTERFACE ANALYSIS, v. 44, (2012), p. 1110-1113. - URL: wileyonlinelibrary.com/journal/sia - vedi dettaglio
  • Maurizio Dapor, "Monte Carlo Simulation of Secondary Electron Emission from Dielectric Targets" in Journal of Physics:Conference Series, Washington: IOP Publishing, 2012. Atti di: IUPAP C20 Conferenceon Computational Physics (CCP2011), Gatlinburg, Tennessee, October 30 — November 3, 2011 - vedi dettaglio
  • Maurizio Dapor, Nicola Bazzanella, Laura Toniutti, Antonio Miotello, Stefano Gialanella, "Backscattered electrons from surface films deposited on bulk targets: A comparison between computational and experimental results" in NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH. SECTION B, BEAM INTERACTIONS WITH MATERIALS AND ATOMS, v. 269, (2011), p. 1672-1674 - vedi dettaglio
  • M. Dapor, "Comparison between Energy Straggling Strategy and Continuous Slowing Down Approximation in Monte Carlo Simulation of Secondary Electron Emission of Insulating Materials" in Progress in NUCLEAR SCIENCE and TECHNOLOGY, Tokyo: Atomic Energy Society of Japan, 2011. Atti di: SNA + MC2010, Tokyo, 17 October -21 October 2010. - URL: http://www.aesj.or.jp/publication/pnst002/index.html - vedi dettaglio
  • M. Dapor, L. Calliari, G. Scarduelli, "Comparison between Monte Carlo and experimental aluminum and silicon electron energy loss spectra" in NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH. SECTION B, BEAM INTERACTIONS WITH MATERIALS AND ATOMS, v. 269, (2011), p. 1675-1678. - DOI: 10.1016/j.nimb.2010.11.030 - vedi dettaglio
  • M.Dapor, A. Miotello, "Reducing Hydrogen Permeation through Metals" in DIFFUSION AND DEFECT DATA, SOLID STATE DATA. PART A, DEFECT AND DIFFUSION FORUM, v. 312-315, (2011), p. 560-565. - URL: www.scientific.net . - DOI: 10.4028/www.scientific.net/DDF.312-315.560 - vedi dettaglio
  • M. Dapor, Relatività e meccanica quantistica relativistica, Roma: Carocci, 2011, 175 p. - (Manuali universitari). - ISBN: 9788843059034 - vedi dettaglio
  • Maurizio Dapor, "Secondary electron emission yield calculation performed using two different Monte Carlo strategies" in NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH. SECTION B, BEAM INTERACTIONS WITH MATERIALS AND ATOMS, v. 269, (2011), p. 1668-1671 - vedi dettaglio
  • A. Koschik, M. Ciappa, S. Holzer, M. Dapor, W. Fichtner, "A novel Monte Carlo simulation code for linewidth measurement in critical dimension scanning electron microscopy" in Proc. of SPIE, Monterey, California, USA: SPIE, 2010, p. 1-12. Atti di: Scanning Microscopy 2010, Monterey, California, USA, 19 May 2010. - DOI: 10.1117/12.853804 - vedi dettaglio
  • Simone Taioli, Stefano Simonucci, Lucia Calliari, Maurizio Dapor, "Electron spectroscopies and inelastic processes in nanoclusters and solids: Theory and experiment" in PHYSICS REPORTS, v. 493, (2010), p. 237-319 - vedi dettaglio
  • C. Rodenburg, M. Jepson, E. Bosch, M. Dapor, "Energy selective scanning electron microscopy to reduce the effect of contamination layers on scanning electron microscope dopant mapping" in ULTRAMICROSCOPY, v. 110, (2010), p. 1185-1191. - DOI: 10.1016/j.ultramic.2010.04.008 - vedi dettaglio
  • C. Rodenburg, E.M. A. Jepson, T.E. G. Bosch, M. Dapor, "ENERGY SELECTIVE SECONDARY ELECTRON DETECTION A SOLUTION TO SITE SPECIFIC SEM DOPANT MAPPING" in RECENT TRENDS IN CHARGED PARTICLE OPTICS AND SURFACE PHYSICS INSTRUMENTATION, BRNO, 612 64, CZECH REPUBLIC: ACAD SCIENCES, CZECH REPUBLIC, INST SCIENTIFIC INSTRUMENTS ASCR, V V I, KRALOVOPOLSKA 147, BRNO, 612 64, CZECH REPUBLIC, 2010. - ISBN: 9788025468425. Atti di: 12th International Seminar of Recent Trends in Charged Particle Optics and Surface Physics Instrumentation , Brno, CZECH REPUBLIC, MAY 31 - JUN 04, 2010 - vedi dettaglio
  • A. Picciotto, D. Margarone, J. Krasa, A.Velyhan, E. Serra, P. Bellutti, G. Scarduelli, L. Calliari, E. Krousky, B. Rus, M. Dapor, "Laser-driven acceleration of protons from hydrogenated annealed silicon targets" in EUROPHYSICS LETTERS, v. Vol. 92, n. no. 3 (2010), p. 340081-340085 - vedi dettaglio
  • Mauro Ciappa, Alexander Koschik, Maurizio Dapor, Wolfgang Fichtner, "Modeling secondary electron images for linewidth measurement by critical dimension scanning electron microscopy" in MICROELECTRONICS RELIABILITY, v. 50, (2010), p. 1407-1412 - vedi dettaglio
  • M. Dapor, M. Ciappa, W. Fichtner, "Monte Carlo modeling in the low-energy domain of the secondary electron emission of polymethylmethacrylate for critical-dimension scanning electron microscopy" in JOURNAL OF MICRO/NANOLITHOGRAPHY, MEMS, AND MOEMS, v. 9, (2010), p. 0230011-0230019. - DOI: 10.1117/1.3373517 - vedi dettaglio
  • M. Dapor, "A Monte Carlo investigation of secondary electron emission from solid targets: Spherical symmetry versus momentum conservation within the classical binary collision model" in NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH. SECTION B, BEAM INTERACTIONS WITH MATERIALS AND ATOMS, v. 267, (2009), p. 3055-3058 - vedi dettaglio
  • S. Taioli, S. Simonucci, L. Calliari, M. Filippi, M. Dapor, "Mixed ab initio quantum mechanical and Monte Carlo calculations of secondary emission from SiO2 nanoclusters" in PHYSICAL REVIEW. B, CONDENSED MATTER AND MATERIALS PHYSICS, v. vol. 79, (2009), p. 0854321-0854328 - vedi dettaglio
  • S. Taioli, S. Simonucci, M. Dapor, "SURPRISES: when ab initio meets statistics in extended systems" in COMPUTATIONAL SCIENCE & DISCOVERY, v. vol. 2, (2009), p. 01500221-01500223 - vedi dettaglio
  • M. Dapor, M. Jepson, B. Inkson, C. Rodenburg, "The Effect of Oxide Overlayers on Secondary Electron Dopant Mapping" in MICROSCOPY AND MICROANALYSIS, v. vol. 15, (2009), p. 237-243 - vedi dettaglio
  • M. Dapor, B.Inkson, C.Rodenburg, J.Rodenburg, "A comprehensive Monte Carlo calculation of dopant contrast in secondary electron imaging" in EUROPHYSICS LETTERS, v. 82, (2008), p. 300061-300065 - vedi dettaglio
  • M. Dapor, "IN PRAISE OF CHANCE" in Negrotti Massimo (a cura di), Yearbook of Artificial, Pieterlen, Switzerland: Peter Lang AG, International Academic Publishers, 2008, p. 103-113. - ISBN: 978-3-03910-972-2 - vedi dettaglio
  • M.Dapor, "Monte Carlo computations of the electron backscattering coefficient for bulk targets and surface thin films" in SURFACE AND INTERFACE ANALYSIS, v. 40, (2008), p. 714-717 - vedi dettaglio
  • M.Dapor, L.Calliari, M.Filippi, "REEL spectra from aluminium: experiment and Monte Carlo simulation using two different dielectric functions" in SURFACE AND INTERFACE ANALYSIS, v. 40, (2008), p. 683-687 - vedi dettaglio
  • M. Dapor, Teoria della relatività, Bologna: Zanichelli, 2008 - vedi dettaglio
  • M. Dapor, L.Calliari, M.Filippi, "Computational and experimental study of pi and pi + sigma plasmon loss spectra for low energy (<1000 eV) electrons impinging on highly oriented pyrolitic graphite (HOPG)" in NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH. SECTION B, BEAM INTERACTIONS WITH MATERIALS AND ATOMS, v. 255, (2007), p. 276-280 - vedi dettaglio
  • M.Dapor, E.Rau, R.Sennov, "Experimental and computational study of the mean energy of electrons" in JOURNAL OF APPLIED PHYSICS, v. 102, (2007), p. 0637051-0637055. - URL: http://link.aip.org/link/?JAP/102/063705 - vedi dettaglio
  • L.Calliari, M.Dapor, M.Filippi, "Joint experimental and computational study of aluminum" in SURFACE SCIENCE, v. 601, (2007), p. 2270-2276 - vedi dettaglio
  • M. Filippi, L. Calliari, M. Dapor, "Joint experimental and computational study of silicon dioxide electron energy loss spectra" in PHYSICAL REVIEW. B, CONDENSED MATTER AND MATERIALS PHYSICS, v. 75, (2007), p. 1254061-1254066 - vedi dettaglio
  • M.Dapor, A.Miotello, "Numerical simulation of hydrogen desorption from a membrane" in ATTI DELLA ACCADEMIA ROVERETANA DEGLI AGIATI. CLASSE DI SCIENZE MATEMATICHE, FISICHE E NATURALI, v. VII, B, (2007), p. 5-9 - vedi dettaglio
  • M.Dapor, A.Miotello, "Numerical simulation of hydrogen desorption from thin metallic films" in NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH. SECTION B, BEAM INTERACTIONS WITH MATERIALS AND ATOMS, v. 255, (2007), p. 92-94 - vedi dettaglio
  • M.Dapor, "A comparative study of electron and positron penetration in silicon dioxide" in JOURNAL OF ELECTRON SPECTROSCOPY AND RELATED PHENOMENA, v. 151, (2006), p. 182-192 - vedi dettaglio
  • M.Dapor, "Cenni di storia della meccanica quantistica" in ANNALI DEL MUSEO CIVICO DI ROVERETO. SEZIONE: ARCHEOLOGIA, STORIA, SCIENZE NATURALI, v. 22, (2006), p. 287-294 - vedi dettaglio
  • M.Dapor, "Energy loss spectra of low primary energy (E <= 1 keV) electrons backscattered by silicon dioxide" in SURFACE SCIENCE, v. 600, (2006), p. 4728-4734 - vedi dettaglio
  • M.Dapor, A.Miotello, A.Sabbioni, "Hydrogen permeation through a slab sample in the case of high hydrogen concentration" in THIN SOLID FILMS, v. 496, (2006), p. 735-739 - vedi dettaglio
  • M.Dapor, "Il metodo di Monte Carlo" in ATTI DELLA ACCADEMIA ROVERETANA DEGLI AGIATI. CLASSE DI SCIENZE MATEMATICHE, FISICHE E NATURALI, v. VI, B, (2006), p. 5-14 - vedi dettaglio
  • M. Dapor, "Monte Carlo simulation of low-medium energy electrons backscattered from C/Al double layer thin films" in SURFACE AND INTERFACE ANALYSIS, v. 38, (2006), p. 1198-1203 - vedi dettaglio
  • M. Dapor, "The Monte Carlo method with applications to electron transport in solids" in Recent Research Developments in Applied Physics, Kerala: Transworld Research Network, 2006, p. 129-152 - vedi dettaglio
  • M. Dapor, M. Ropele, Elaborazione dei dati sperimentali, Milano: Springer Italia, 2005 - vedi dettaglio
  • M. Dapor, "Electron-beam penetration in surface films" in ATTI DELLA ACCADEMIA ROVERETANA DEGLI AGIATI. CLASSE DI SCIENZE MATEMATICHE, FISICHE E NATURALI, v. V, B, (2005), p. 47-57 - vedi dettaglio
  • M.Dapor, "Monte Carlo simulation of electron depth distribution and backscattering for carbon films deposited on aluminium as a function of incidence angle and primary energy" in NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH. SECTION B, BEAM INTERACTIONS WITH MATERIALS AND ATOMS, v. 228, (2005), p. 337-340 - vedi dettaglio
  • M. Dapor, "Monte Carlo Simulation of Electrons Backscattered from Surface Carbon Films" in Bernardette Kirk, Jeffrey Johnson (a cura di), The Monte Carlo Method: Versatility Unbounded in a Dynamic Computing World, La Grange Park: American Nuclear Society, 2005, p. 1-13. - ISBN: 9780894486951 - vedi dettaglio
  • M. Dapor, "An analytical approximation of the differential elastic scattering cross-section for electrons in selected oxides" in PHYSICS LETTERS A, v. 333, (2004), p. 457-467 - vedi dettaglio
  • M. Dapor, "Backscattering of Low Energy Electrons from Carbon Films Deposited on Aluminum: a Monte Carlo Simulation" in JOURNAL OF APPLIED PHYSICS, v. 95, (2004), p. 718-721 - vedi dettaglio
  • M. Dapor, "Elogio del caso" in ATTI DELLA ACCADEMIA ROVERETANA DEGLI AGIATI. CLASSE DI SCIENZE MATEMATICHE, FISICHE E NATURALI, v. IV-B, (2004), p. 37-46 - vedi dettaglio
  • L. C. Aiello, M.Dapor, "Intelligenza artificiale: i primi 50 anni" in MONDO DIGITALE, v. III - n.2, (2004), p. 3-20 - vedi dettaglio
  • M. Dapor, Electron-Beam Interactions with Solids. Application of the Monte Carlo Method to Electron Scattering Problems, Berlin, Heidelberg: Springer, 2003. - ISBN: 9783540006527 - vedi dettaglio
  • M. Dapor, "Monte Carlo simulation of the interaction of electrons with supported and unsupported thin films" in NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH. SECTION B, BEAM INTERACTIONS WITH MATERIALS AND ATOMS, v. 202, (2003), p. 155-160 - vedi dettaglio
  • M. Dapor, "Comparison of the results of analytical and numerical model calculations of electron backscattering from supported films" in THE EUROPEAN PHYSICAL JOURNAL. APPLIED PHYSICS, v. 18, (2002), p. 155-162 - vedi dettaglio
  • M. Dapor, L`intelligenza della vita: dal caos all`uomo, Milano: Springer Italia, 2002. - ISBN: 9788847001862 - vedi dettaglio
  • M. Dapor, M. Ropele (trad.), "Antimateria", di Gordon Fraser, Milano: McGraw-Hill, 2001. - Titolo originale: "Antimatter: The Ultimate Mirror" - vedi dettaglio
  • M. Dapor, A. Miotello, "Monte Carlo simulation of few-keV positrons penetrating in solids" in A. Kling, F. Barao, M. Nakagawa, L. Tavora, P. Vaz (a cura di), Advanced Monte Carlo for Radiation Physics, Particle Transport Simulation and Applications, Berlin, Heidelberg: Springer, 2000, p. 43-47. - ISBN: 3-540-41795-8 - vedi dettaglio
  • M. Dapor, A. Miotello, D. Zari, "Monte Carlo simulation of positron-stimulated secondary electron emission from solids" in PHYSICAL REVIEW. B, CONDENSED MATTER AND MATERIALS PHYSICS, v. 61, (2000), p. 5979-5986 - vedi dettaglio
  • M.Dapor, A.Miotello, "Backscattering of electrons from selected oxides: MgO, SiO2, and Al2O3" in THE EUROPEAN PHYSICAL JOURNAL. APPLIED PHYSICS, v. 5, (1999), p. 143-148 - vedi dettaglio
  • M. Dapor, Electron-atom scattering: an introduction, New York: Nova Science, 1999. - ISBN: 1560727586 - vedi dettaglio
  • M. Dapor, Sfere di cristallo, Torino: Editrice La Stampa, 1999. - ISBN: 8877831251 - vedi dettaglio
  • M.Dapor, A.Miotello, "Backscattering of Positrons from Solid Targets" in SCANNING MICROSCOPY, v. 12, (1998), p. 131-138 - vedi dettaglio
  • M.Dapor, A.Miotello, "Differential, total, and transport elastic cross-sections of low energy positrons scattered by neutral atoms (Z=1-92, E=500-4000 eV)" in ATOMIC DATA AND NUCLEAR DATA TABLES, v. 69, (1998), p. 1-100 - vedi dettaglio
  • M.Dapor, A.Miotello, "Electron Irradiation of Dielectric Solids: Surface Electric Field Calculation" in SURFACE AND INTERFACE ANALYSIS, v. 26, (1998), p. 531-533 - vedi dettaglio
  • A.Miotello, R.Kelly, M.Dapor, "Fast Charged-Particle Irradiation of Solids: Excitation of Secondary Electrons and Related Energy Deposition Function in SiO2" in NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH. SECTION B, BEAM INTERACTIONS WITH MATERIALS AND ATOMS, v. 141, (1998), p. 16-24 - vedi dettaglio
  • M. Dapor, L`orologio di Albert, Torino: Editrice La Stampa, 1998. - ISBN: 8877831200 - vedi dettaglio
  • M. Dapor, A. Miotello, "Slow Electrons Impinging on Dielectric Systems: I. Basic Aspects" in PHYSICAL REVIEW. B, CONDENSED MATTER, v. 56, (1997), p. 2234-2240 - vedi dettaglio
  • A. Miotello, M. Dapor, "Slow Electrons Impinging on Dielectric Systems: II. Implantation Profiles, Mobility and Recombination Processes" in PHYSICAL REVIEW. B, CONDENSED MATTER, v. 56, (1997), p. 2241-2247 - vedi dettaglio
  • M.Dapor, "Elastic scattering calculations for electrons and positrons in solid targets" in JOURNAL OF APPLIED PHYSICS, v. 79, (1996), p. 8406-8411 - vedi dettaglio
  • M.Dapor, "Analytical transport cross section of medium energy positrons elastically scattered by complex atoms (Z=1-92)" in JOURNAL OF APPLIED PHYSICS, v. 77, (1995), p. 2840-2842 - vedi dettaglio
  • M.Dapor, "Elastic Scattering of Electrons by Atoms: Differential and Transport Cross Section Calculations" in NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH. SECTION B, BEAM INTERACTIONS WITH MATERIALS AND ATOMS, v. 95, (1995), p. 470-476 - vedi dettaglio
  • M. Dapor, "Penetration of Positrons in Solid Targets" in SCANNING MICROSCOPY, v. 9, (1995), p. 939-948 - vedi dettaglio
  • M.Dapor, L.Stringa, "Reti neurali artificiali" in AEI AUTOMAZIONE ENERGIA INFORMAZIONE, v. 1994, (1994), p. 107-117 - vedi dettaglio
  • M. Dapor, "Backscattering of electrons from multilayers" in PHYSICAL REVIEW. B, CONDENSED MATTER, v. 48, (1993), p. 3003-3008 - vedi dettaglio
  • M.Dapor, "Mean energy and depth of penetration of electrons backscattered by solid targets" in APPLIED SURFACE SCIENCE, v. 70/71, (1993), p. 327-331 - vedi dettaglio
  • V.Malina, E.Hajkova, J.Zelinka, M.Dapor, V.Micheli, "Non-alloyed Ti/Au and Ti/Pt/Au ohmic contacts to p-type InGaAsP" in THIN SOLID FILMS, v. 223, (1993), p. 146-153 - vedi dettaglio
  • Y.Massiani, P.Gravier, J.Crousier, L.Fedrizzi, M.Dapor, V.Micheli, L.Roux, "Effects of ion beam implantation on the corrosion behaviour of TiN-coated Ti-6Al-4V alloy" in SURFACE & COATINGS TECHNOLOGY, v. 52, (1992), p. 159-167 - vedi dettaglio
  • M. Dapor, "Monte Carlo simulation of backscattered electrons and energy from thick targets and surface films" in PHYSICAL REVIEW. B, CONDENSED MATTER, v. 46, (1992), p. 618-625 - vedi dettaglio
  • M.Dapor, G.Cicolini, F.Giacomozzi, M.Boscardin, G.Queirolo, "Seeman-Bohlin x-ray diffraction study of Al-1%Si thin films used in ULSI devices" in MATERIALS LETTERS, v. 13, (1992), p. 142-146 - vedi dettaglio
  • M.Dapor, "Theory of the interaction between an electron beam and a thin solid film" in SURFACE SCIENCE, v. 269/270, (1992), p. 753-762 - vedi dettaglio
  • D.Bisero, M.Dapor, B.Margesin, "X-ray diffraction study of P-doped polycrystalline Si thin films used in ULSI devices" in MATERIALS LETTERS, v. 14, (1992), p. 303-306 - vedi dettaglio
  • L.Fedrizzi, R.Fratesi, G.Biscaglia, G.Roventi, M.Dapor, P.Bonora, "Caratterizzazione di laminati zincati di produzione industriale" in METALLURGIA ITALIANA, v. 83, (1991), p. 363-368 - vedi dettaglio
  • M. Dapor, "Diffrazione dei raggi X" in M. G. Cattania, Mariano Anderle (a cura di), Metodi per la caratterizzazione chimico-fisica.., Bologna: Pàtron, 1991, p. 185-191 - vedi dettaglio
  • M. Dapor, "Monte Carlo simulation of the energy deposited by few keV electrons penetrating in thick targets" in PHYSICS LETTERS A, v. 158, (1991), p. 425-430 - vedi dettaglio
  • M. Dapor, "Penetration of an electron beam in a thin solid film: The influence of backscattering from the substrate" in PHYSICAL REVIEW. B, CONDENSED MATTER, v. 42, (1991), p. 10118-10123 - vedi dettaglio
  • S.Vidwans, A.Narsale, V.Salvi, A.Rangwala, L.Guzman, F.Marchetti, M.Dapor, L.Calliari, "Auger electron spectroscopy and x-ray diffraction studies of Ti-Si layers synthesised by ion implantation" in RADIATION EFFECTS AND DEFECTS IN SOLIDS, v. 114, (1990), p. 93-97 - vedi dettaglio
  • F.Marchetti, M.Dapor, S.Girardi, M.Cipparrone, P.Tiscione, "Auger quantitative analysis and preferential sputtering in brass alloys" in VACUUM, v. 41, (1990), p. 1706-1709 - vedi dettaglio
  • M.Dapor, "Backscattering of electrons from solid targets" in PHYSICS LETTERS A, v. 151, (1990), p. 84-89 - vedi dettaglio
  • L.Fedrizzi, Y.Massiani, J.Crousier, M.Dapor, P.Bonora, "Electrochemical characterization of magnetron sputter-deposited Nb-Zr thin metal films" in CORROSION, v. 46, (1990), p. 499-505 - vedi dettaglio
  • A.Paccagnella, L.Wang, C.Canali, G.Castellaneta, M.Dapor, G.Donzelli, E.Zanoni, S.Lau, "Pd/Ge ohmic contacts for GaAs metal-semiconductor field effect transistors: technology and performance" in THIN SOLID FILMS, v. 187, (1990), p. 9-18 - vedi dettaglio
  • L. Calliari, M. Dapor, L. Gonzo, F. Marchetti, "Role of core levels ionization in the electron induced dissociation of silicon dioxide" in G. Betz, P. Varga (a cura di), Desorption Induced by Electronic Transitions, Berlin, Heidelberg: Springer, 1990, p. 373-378 - vedi dettaglio
  • M.Dapor, F.Marchetti, "Development of a numerical simulation of depth profiles of multilayers composed of very thin layers" in SURFACE AND INTERFACE ANALYSIS, v. 14, (1989), p. 524-528 - vedi dettaglio
  • L.Fedrizzi, S.Gialanella, M.Elena, M.Dapor, L.Guzman, "Electrochemical and corrosion behaviour of BN-coated aluminium alloy surfaces" in MATERIALS SCIENCE AND ENGINEERING A-STRUCTURAL MATERIALS PROPERTIES MICROSTRUCTURE AND PROCESSING, v. A116, (1989), p. 47-52 - vedi dettaglio
  • P.Raole, A.Narsale, D.Kothari, P.Pawar, S.Gogawale, L.Guzman, M.Dapor, "Glancing angle x-ray diffraction and x-ray photoelectron spectroscopy studies of nitrogen-implanted tantalum" in MATERIALS SCIENCE AND ENGINEERING A-STRUCTURAL MATERIALS PROPERTIES MICROSTRUCTURE AND PROCESSING, v. A115, (1989), p. 73-77 - vedi dettaglio
  • M.Dapor, "Penetration of an electron beam in a solid material: a simple model and a numerical simulation" in PHYSICS LETTERS A, v. 143, (1989), p. 160-164 - vedi dettaglio
  • F.Marchetti, M.Dapor, S.Girardi, F.Giacomozzi, A.Cavalleri, "Physical properties of TiN thin films" in MATERIALS SCIENCE AND ENGINEERING A-STRUCTURAL MATERIALS PROPERTIES MICROSTRUCTURE AND PROCESSING, v. A115, (1989), p. 217-221 - vedi dettaglio
  • P.Pawar, D.Kothari, A.Narsale, P.Raole, S.Gogawale, L.Guzman, S.Girardi, M.Dapor, M.Anderle, R.Canteri, "Structural investigation of Al2O3 formed by ion implantation at various doses" in NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH. SECTION B, BEAM INTERACTIONS WITH MATERIALS AND ATOMS, v. B39, (1989), p. 670-674 - vedi dettaglio
  • M.Sarkar, M.Dapor, "K x-ray emission spectra from eta-Al2O3" in NUOVO CIMENTO DELLA SOCIETÀ ITALIANA DI FISICA. D CONDENSED MATTER, ATOMIC, MOLECULAR AND CHEMICAL PHYSICS, BIOPHYSICS, v. 10 D, (1988), p. 1125-1128 - vedi dettaglio
  • A.Cavalleri, M.Dapor, F.Giacomozzi, L.Guzman, P.Ossi, "Preparation of metal glasses by ion implantation and/or sputtering" in ZEITSCHRIFT FUR PHYSIKALISCHE CHEMIE, v. 157, (1988), p. 239-244 - vedi dettaglio
  • A.Cavalleri, M.Dapor, F.Giacomozzi, L.Guzman, P.Ossi, M.Scotoni, "Superconductivity in crystalline and amorphous Nb-Zr thin films" in MATERIALS SCIENCE AND ENGINEERING A-STRUCTURAL MATERIALS PROPERTIES MICROSTRUCTURE AND PROCESSING, v. 99, (1988), p. 201-205 - vedi dettaglio
  • F. Schaefers, M. Grioni, J. Wood, H. V. Brug, E. Puik, M. Dapor, F. Marchetti, "X-Ray multilayers for diffractometers, monochromators, and spectrometers" in Proceedings of SPIE, Washington: International Society for Optical Engineering, 1988, p. 23-30. Atti di: X-Ray Multilayers for Diffractometers, Monochromators, and Spectrometers, San Diego, California, 17-19 August 1988 - vedi dettaglio
  • V.Salvi, A.Narsale, S.Vidwans, A.Rangwala, L.Guzman, M.Dapor, G.Giunta, L.Calliari, F.Marchetti, "Formation of vanadium silicide by high dose ion implantation" in SURFACE SCIENCE, v. 189/190, (1987), p. 1143-1149 - vedi dettaglio
  • M.Dapor, M.Elena, S.Girardi, G.Giunta, L.Guzman, A.Narsale, "Stoichiometry in Ti-N barrier layers studied by x-ray emission spectroscopy" in THIN SOLID FILMS, v. 153, (1987), p. 303-311 - vedi dettaglio
  • G.Cognola, M.Dapor, S.Zerbini, "Canonical transformations for relativistic particles" in PHYSICS LETTERS A, v. 103A, (1984), p. 363-365 - vedi dettaglio