Research Outputs Alessandro Paccagnella


  • M. Da Rold, N. Bacchetta, G. F. Dalla Betta, R. Dell'orso, P. Fuochi, M. Manfredi, A. Messineo, O. Militaru, A. Paccagnella, G. Verzellesi, R. Wheadon, "Multiguard structures for high voltage operation of radiation damaged silicon detectors" in NUOVO CIMENTO. A, v. A 112, n. 1-2 (1999), p. 13-22 - see details
  • G. Verzellesi, G. F. Dalla Betta, M. Darold, G. Pignatel, A. Paccagnella, L. Bosisio, "Self-limitation of edge-generated currents in single-sided microstrip detectors after type inversion", 1999. Proceedings of: IEEE Nuclear Science Symposium and Medical Imaging Conference, NSS-MIC 1999, Seattle (USA), 24-30 Ottobre 1999 - see details
  • M. Da Rold, N. Bacchetta, D. Bisello, A. Paccagnella, G. F. Dalla Betta, G. Verzellesi, O. Militaru, R. Wheadon, P. Fuochi, C. Bozzi, R. Dell'orso, A. Messineo, G. Tonelli, P. Verdini, "Study of breakdown effects in silicon multiguard structures" in IEEE TRANSACTIONS ON NUCLEAR SCIENCE, v. 46, n. 4 (1999), p. 1215-1223 - see details
  • N. Bacchetta, D. Bisello, A. Candelori, M. Cavone, G. F. Dalla Betta, M. Da Rold, G. De Liso, R. Dell'orso, P. Fuochi, A. Messineo, O. Militaru, A. Paccagnella, G. Tonelli, P. Verdini, G. Verzellesi, R. Wheadon, "High voltage operation of silicon devices for LHC experiments" in NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH. SECTION A, ACCELERATORS, SPECTROMETERS, DETECTORS AND ASSOCIATED EQUIPMENT, v. 409, (1998), p. 139-141 - see details
  • N. Bacchetta, D. Bisello, M. Da Rold, F. Finotto, A. Paccagnella, G. F. Dalla Betta, G. Verzellesi, "Optimisation of multiguard structures for breakdown protection in silicon detectors", 1998. Proceedings of: European Symposium on Semiconductor Detectors, Schloss Elmau (Germania), 14-17 Giugno 1998 - see details
  • M. Da Rold, A. Paccagnella, A. Da Re, G. Verzellesi, N. Bacchetta, R. Wheadon, G. F. Dalla Betta, A. Candelori, G. Soncini, D. Bisello, "Radiation effects on breakdown characteristics of multiguarded devices" in IEEE TRANSACTIONS ON NUCLEAR SCIENCE, v. 44, n. 3 (1997), p. 721-728 - see details
  • N. Bacchetta, D. Bisello, A. Candelori, G. F. Dalla Betta, A. Dare, M. Da Rold, P. Fardin, A. Paccagnella, G. Soncini, G. Verzellesi, R. Wheadon, "Breakdown properties of multiguarded devices", 1996, p. 563-567. Proceedings of: IEEE Nuclear Science Symposium, Anaheim (Calif.), 2-9 November 1996 - see details
  • A. Paccagnella, M. Ceschia, G. Verzellesi, G. F. Dalla Betta, P. Bellutti, P. Fuochi, G. Soncini, "Forward and reverse characteristics of irradiated MOSFET's" in IEEE TRANSACTIONS ON NUCLEAR SCIENCE, v. 43, n. 3 (1996), p. 797-804 - see details
  • A. Paccagnella, M. Ceschia, G. Verzellesi, G. F. Dalla Betta, P. Fuochi, M. Zen, G. Soncini, "Asymmetrical oxide-charge build-up in irradiated p-MOSFET's": MIDEM, 1995, p. 201-206. Proceedings of: 23rd International Conference on Microelectronics, MIEL '95. 31st Symposium on Devices and Materials, SD '95, Terme Catez, 27-29 September 1995 - see details
  • A.Paccagnella, L.Wang, C.Canali, G.Castellaneta, M.Dapor, G.Donzelli, E.Zanoni, S.Lau, "Pd/Ge ohmic contacts for GaAs metal-semiconductor field effect transistors: technology and performance" in THIN SOLID FILMS, v. 187, (1990), p. 9-18 - see details
  • G. Carturan, G. Della Mea, A. Paccagnella, G. D. Sorarù, C. Rizzo, "Durability Against Ca(OH)2 Attack of Soda-Lime Glass Coated by Various" in JOURNAL OF NON-CRYSTALLINE SOLIDS, v. 111, (1989), p. 91-97 - see details